JEOL LSM-6400F scanning electron microscope – SEM

Product Description

For sale: JEOL LSM-6400F scanning electron microscope – SEM

State: In very good condition, as-is, where-is
Complete system, Year of construction 1996-1998
Dismantled in working condition in May 2021.
Packed and in storage in our conditioned warehouse.
Inspection available by appointment

Specifications:

• Resolution: 1.5 nm at 30 kV and at 8mm WD
• Magnification: 10X to 500 000X
• Probe current:: 10-12 to 10-10 A
• Electron gun:  Cold-cathode field emission
• Detectors: Scintillator/photomultiplier
• GW Electronic System 47 backscattered detector
• Accelerating Voltage: 500V to 30kV
• Specimen Stage:    Type: Fully Eucentric goniometer stage
• Movements: X = 100mm
• Y = 110mm
• Z = 34mm
• Tilt: -5˚to 60˚
• Rotation: 360˚ endless
• Specimen exchange:  By airlock: Up to 150mm dia. Specimen holders
• By stage drawout: 200mm dia. or larger specimen holders

General information:
SEM is a method for high-resolution imaging of surfaces. An incident electron beam is scanned across the sample’s surface, and the resulting electrons emitted from the sample are attracted and collected by a detector and translated into a signal. Imaging in a SEM can be done using secondary electrons to obtain fine surface topographical features or with backscattered electrons which give contrast based on atomic number.

Applications:
Micrography, analysis of cracks and fracture surfaces, bond failures and physical defects. Compositional analysis to identify materials and contaminants and their relative concentration on the surface.

Additional Information