Product Description
For sale: JEOL LSM-6400F scanning electron microscope – SEM
State: In very good condition, as-is, where-is
Complete system, Year of construction 1996-1998
Dismantled in working condition in May 2021.
Packed and in storage in our conditioned warehouse.
Inspection available by appointment
Specifications:
- Resolution: 1.5 nm at 30 kV and at 8mm WD
- Magnification: 10X to 500 000X
- Probe current:: 10-12 to 10-10 A
- Electron gun: Cold-cathode field emission
- Detectors: Scintillator/photomultiplier
- GW Electronic System 47 backscattered detector
- Accelerating Voltage: 500V to 30kV
- Specimen Stage: Type: Fully Eucentric goniometer stage
- Movements: X = 100mm
- Y = 110mm
- Z = 34mm
- Tilt: -5˚to 60˚
- Rotation: 360˚ endless
- Specimen exchange: By airlock: Up to 150mm dia. Specimen holders
- By stage drawout: 200mm dia. or larger specimen holders
General information:
SEM is a method for high-resolution imaging of surfaces. An incident electron beam is scanned across the sample’s surface, and the resulting electrons emitted from the sample are attracted and collected by a detector and translated into a signal. Imaging in a SEM can be done using secondary electrons to obtain fine surface topographical features or with backscattered electrons which give contrast based on atomic number.
Applications:
Micrography, analysis of cracks and fracture surfaces, bond failures and physical defects. Compositional analysis to identify materials and contaminants and their relative concentration on the surface.