For sale: JEOL LSM-6400F scanning electron microscope – SEM
State: In very good condition, as-is, where-is
Complete system, Year of construction 1996-1998
Dismantled in working condition in May 2021.
Packed and in storage in our conditioned warehouse.
Inspection available by appointment
- Resolution: 1.5 nm at 30 kV and at 8mm WD
- Magnification: 10X to 500 000X
- Probe current:: 10-12 to 10-10 A
- Electron gun: Cold-cathode field emission
- Detectors: Scintillator/photomultiplier
- GW Electronic System 47 backscattered detector
- Accelerating Voltage: 500V to 30kV
- Specimen Stage: Type: Fully Eucentric goniometer stage
- Movements: X = 100mm
- Y = 110mm
- Z = 34mm
- Tilt: -5˚to 60˚
- Rotation: 360˚ endless
- Specimen exchange: By airlock: Up to 150mm dia. Specimen holders
- By stage drawout: 200mm dia. or larger specimen holders
SEM is a method for high-resolution imaging of surfaces. An incident electron beam is scanned across the sample’s surface, and the resulting electrons emitted from the sample are attracted and collected by a detector and translated into a signal. Imaging in a SEM can be done using secondary electrons to obtain fine surface topographical features or with backscattered electrons which give contrast based on atomic number.
Micrography, analysis of cracks and fracture surfaces, bond failures and physical defects. Compositional analysis to identify materials and contaminants and their relative concentration on the surface.